MultiMode V SPM

MultiMode V SPM
The world's highest resolution SPM

Get the high-performance, state-of-the-art SPM features you need in the world’s highest resolution SPM with the MultiMode V Scanning Probe Microscope. Representing the next generation of the world's best-selling, most field-proven SPM, the MultiMode V SPM performs the full range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics like topography, elasticity, friction, adhesion, and magnetic/electrical fields.

MultiMode V SPM
   Data Sheets
 
  • A short mechanical path length between probe tip and sample provides very fast scan rates with the utmost precision
  • NanoScope V controller delivers reliable, high-speed data capture of high-pixel-density images (5120 x 5120)
  • Record and analyze tip-sample interactions of nanoscale events at timescales previously inaccessible to SPM
  • Available with closed-loop scanner option
  • Enables up to eight images to be simultaneously displayed/captured
  • EasyAFM software package provide easy-to-follow graphic user interface for new or infrequent SPM users
 
  • The MultiMode V Scanning Probe Microscope (SPM)
    Low Res [878 KB pdf ]

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